Efectos de la exposición a vacío y aire de películas de SnO2 con distinto espesor

Materials Research. 2003;6(4):515-518

 

Journal Homepage

Journal Title: Materials Research

ISSN: 1516-1439 (Print)

Publisher: Associação Brasileira de Metalurgia e Materiais (ABM); Associação Brasileira de Cerâmica (ABC); Associação Brasileira de Polímeros (ABPol)

LCC Subject Category: Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials

Country of publisher: Brazil

Language of fulltext: English

Full-text formats available: PDF, HTML, XML

 

AUTHORS

Ponce Miguel Adolfo
Castro Miriam Susana
Moncada Osvaldo Julio
Echeverría Maria Dolores
Aldao Celso Manuel

EDITORIAL INFORMATION

Peer review

Editorial Board

Instructions for authors

Time From Submission to Publication: 36 weeks

 

Abstract | Full Text

Gas sensors based in semiconductor oxides show a change in the resistance when they are exposed to certain gaseous atmospheres. In this paper, the influence on the sensor electrical resistance with the film thickness in vacuum and air are studied. The conduction process is analyzed considering the existence of Schottky potential barriers at the grain boundaries. These barriers are affected by the intergranular gas diffusion. This process increases the barrier height and width, altering the electrical resistance. Also, the influence of the diffusion process on the stabilization time is analized.