Crystals (Apr 2020)

Capacitance Characteristics and Breakdown Mechanism of AlGaN/GaN Metal–Semiconductor–Metal Varactors and their Anti-Surge Application

  • Chien-Fu Shih,
  • Yu-Li Hsieh,
  • Liann-Be Chang,
  • Ming-Jer Jeng,
  • Zi-Xin Ding,
  • Shao-An Huang

DOI
https://doi.org/10.3390/cryst10040292
Journal volume & issue
Vol. 10, no. 4
p. 292

Abstract

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The AlGaN/GaN materials with a wide band gap, high electron mobility, and high breakdown voltage are suitable for manufacturing high-power and high-frequency electronic devices. In this study, metal Schottky contact electrodes of different dimensions are prepared on AlGaN/GaN wafers to fabricate metal–semiconductor–metal (MSM) varactors. Voltage-dependent capacitance and breakdown voltages of the varactors are measured and studied. The corresponding breakdown mechanisms of varactors with different electrode gaps are proposed. Furthermore, an anti-surge application using GaN-based MSM varactors in a signal transmission module is demonstrated, and its surge suppression capability is shown. We believe that our study will be beneficial in developing surge protection circuits for RF applications.

Keywords