Structure and composition of a composite of porous silicon with deposited copper

Abstract

Porous silicon is a promising nanomaterial for optoelectronics and sensorics, as it has a large specific surface area and is photoluminescent under visible light. The deposition of copper particles on the surface of porous silicon will greatly expand the range of applications of the resulting nanocomposites. Copper was chosen due to its low electrical resistivity and high resistance to electromigration compared to other metals. The purpose of this research was to study changes in the structure and composition of porous silicon after the chemical deposition of copper. Porous silicon was obtained by the anodisation of monocrystalline silicon wafers KEF (100) (electronic-grade phosphorus-doped silicon) with an electrical resistivity of 0.2 Ohm·cm. An HF solution in isopropyl alcohol with the addition of H2O2 solution was used to etch the silicon wafers. The porosity of the samples was about 70 %. The porous silicon samples were immersed in copper sulphate solution (CuSO4·5H2O) for 7 days. We used scanning electron microscopy, IR spectroscopy, and ultrasoft X-ray emission spectroscopy to obtain data on the morphology and composition of the initial sample and the sample with deposited copper. The chemical deposition of copper on porous silicon showed a significant distortion of the pore shape as well as the formation of large cavities inside the porous layer. However, in the lower part the pore morphology remained the same as in the original sample. It was found that the chemical deposition of copper on porous silicon leads to copper penetrating into the porous layer, the formation of a composite structure, and it prevents the oxidation of the porous layer during storage. Thus, it was demonstrated that the chemical deposition of copper on a porous silicon surface leads to visible changes in the surface morphology and composition. Therefore, it should have a significant impact on the catalytic, electrical, and optical properties of the material

Keywords

• porous silicon
• composites
• copper
• ultrasoft x-ray emission spectroscopy
• electronic structure