Wide angle X-ray diffraction patterns and 2D-correlation spectroscopy of crystallization in proton irradiated poly(ether ether ketone)

Abstract

Proton irradiated poly (ether ether ketone) (PEEK) films were crystallized to different extents, and subsequently characterized by wide angle X-ray diffraction technique. The data were analyzed by two-dimensional correlation mapping (2D-CM), in particular: Generalized, hybrid and multiple perturbations correlation approaches. Two asynchronous correlation peaks at (19.1, 18.7) o and at (22.5, 19.1) o were utilized as a measure the crystal perfection and the preferred process; orientation/crystal growth respectively. Proton irradiation not only favored the formation of crystal form II, but also changed the type of orientation within the irradiated films. Differential scanning calorimetry and Raman spectroscopic analysis confirmed the contribution of the previous two factors. Raman spectra indicated that the intensity of both bands at 1595 and 1608 cm−1 decreased on samples crystallized from the melt, but increased on cold crystallized samples. 2D-CM combined with other suitable techniques is a promising in evaluating the structure of polymers and revealing the effect of proton irradiation.

Keywords

• PEEK
• Proton irradiation
• 2D-CM
• X-ray diffraction
• Orientation