Sensors (Oct 2017)

The Fabrication and Characterization of Ni/4H-SiC Schottky Diode Radiation Detectors with a Sensitive Area of up to 4 cm2

  • Lin-Yue Liu,
  • Ling Wang,
  • Peng Jin,
  • Jin-Liang Liu,
  • Xian-Peng Zhang,
  • Liang Chen,
  • Jiang-Fu Zhang,
  • Xiao-Ping Ouyang,
  • Ao Liu,
  • Run-Hua Huang,
  • Song Bai

DOI
https://doi.org/10.3390/s17102334
Journal volume & issue
Vol. 17, no. 10
p. 2334

Abstract

Read online

Silicon carbide (SiC) detectors of an Ni/4H-SiC Schottky diode structure and with sensitive areas of 1–4 cm2 were fabricated using high-quality lightly doped epitaxial 4H-SiC material, and were tested in the detection of alpha particles and pulsed X-rays/UV-light. A linear energy response to alpha particles ranging from 5.157 to 5.805 MeV was obtained. The detectors were proved to have a low dark current, a good energy resolution, and a high neutron/gamma discrimination for pulsed radiation, showing the advantages in charged particle detection and neutron detection in high-temperature and high-radiation environments.

Keywords