Structured light projection provides a promising approach to achieving fast and non-contact three-dimensional (3D) imaging. The resolution is a crucial index that represents security and accuracy in applications such as face recognition and robot vision. It depends on the density of dots in the projection. However, further improving the density of dots in the current system must be at the cost of speed or volume. Here, an all-dielectric ultra-thin metasurface is designed and fabricated to project a multi-wavelength dot array. The density of dots is improved because projected dots with different wavelengths fill the gaps with each other. The experimental results demonstrate that the multi-wavelength projection improves the resolution of 3D imaging. Furthermore, the multi-wavelength system is beneficial to measuring a surface with varying colors. The approach has the potential to achieve a new generation of high-resolution systems for tiny fluctuations and colorful 3D imaging in dark environments.
