Ultrafast current imaging by Bayesian inversion

S. Somnath; K. J. H. Law; A. N. Morozovska; P. Maksymovych; Y. Kim; X. Lu; M. Alexe; R. Archibald; S. V. Kalinin; S. Jesse; R. K. Vasudevan

doi:10.1038/s41467-017-02455-7

Nature Communications (Feb 2018)

Ultrafast current imaging by Bayesian inversion

S. Somnath,
K. J. H. Law,
A. N. Morozovska,
P. Maksymovych,
Y. Kim,
X. Lu,
M. Alexe,
R. Archibald,
S. V. Kalinin,
S. Jesse,
R. K. Vasudevan

Affiliations

S. Somnath: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
K. J. H. Law: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
A. N. Morozovska: Institute of Physics, National Academy of Sciences of Ukraine
P. Maksymovych: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
Y. Kim: School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU)
X. Lu: The State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, Xidian University
M. Alexe: Department of Physics, University of Warwick
R. Archibald: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
S. V. Kalinin: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
S. Jesse: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
R. K. Vasudevan: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory

DOI: https://doi.org/10.1038/s41467-017-02455-7
Journal volume & issue: Vol. 9, no. 1
pp. 1 – 11

Abstract

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Scanning probe microscopy is widely used to characterize material properties with atomic resolution, yet electronic property mapping is normally constrained by slow data acquisition. Somnath et al. show a current–voltage method, which enables fast electronic spectroscopy mapping over micrometer-sized areas.

Published in Nature Communications

ISSN: 2041-1723 (Online)
Publisher: Nature Portfolio
Country of publisher: United Kingdom
LCC subjects: Science
Website: https://www.nature.com/ncomms/

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