BOD circuit of low cost and high reliability based on deep submicron

Abstract

In MCU and other application systems, the system power supply voltage is often under-voltage or unexpectedly power-off, resulting in the MCU program “run away” or loss of important data. In order to avoid these situations as far as possible, the brown-out detection circuit can detect the abnormal power supply of the system, so as to improve the anti-interference ability and stability of the system. In this paper, a brown-out detection circuit based on 180 nm technology is proposed, which has the advantages of simple structure, stable and reliable operation and small layout area. It can be integrated into MCU and other microprocessors to monitor the power supply voltage of the system, reduce the peripheral devices of the system and reduce the system cost. The circuit structure can be easily migrated to other process nodes, and has good process migration characteristics and wide application.

Keywords

• mcu
• brown-out detect
• brown-out protection
• power-on reset
• brown-out reset