Kuangchan zonghe liyong (Dec 2022)

Review for High-purity Quartz (SiO2) (Part Ⅱ): Activation and Separation of Lattice Impurities

  • Min Lin,
  • Qian Jia,
  • Ziyuan Liu,
  • Yan Wei,
  • Bin Liu,
  • Yu Meng,
  • Hang Qiu,
  • Shunqiu Xu,
  • Shaomin Lei

DOI
https://doi.org/10.3969/j.issn.1000-6532.2022.06.004
Journal volume & issue
Vol. 43, no. 6
pp. 21 – 25

Abstract

Read online

High-purity quartz, famous for low impurities and high purity, has been widely used in optical fiber communication, photovoltaic, aerospace, semiconductor display and other high-tech industries. The trace metal and nonmetallic elements (H, Li, B, Na, Al, P, K, Ca, Fe, Ti, etc.) widely occurring in quartz crystal structure are closely bound by Si-O-Si bond, which is difficult to be separated by conventional mineral processing technology. In this paper, the occurrence mechanism of trace elements bound by lattice in high-purity quartz is described in detail, and the advanced separation technology of trace elements in the crystal structure of high-quality quartz in the world is comprehensively and systematically summarized. Based on the research progress of the basic theory of high-purity quartz in China in recent years, some reasonable scientific suggestions on the basic theory of impurity separation of high-purity quartz lattice in China are put forward.

Keywords