Design Rule of Mach-Zehnder Interferometer Sensors for Ultra-High Sensitivity
Yiwei Xie,
Ming Zhang,
Daoxin Dai
Affiliations
Yiwei Xie
Centre for Optical and Electromagnetic Research, State Key Laboratory for Modern Optical Instrumentation, College of Optical Science and Engineering, International Research Center for Advanced Photonics, Zhejiang University, Zijingang Campus, Hangzhou 310058, China
Ming Zhang
Centre for Optical and Electromagnetic Research, State Key Laboratory for Modern Optical Instrumentation, College of Optical Science and Engineering, International Research Center for Advanced Photonics, Zhejiang University, Zijingang Campus, Hangzhou 310058, China
Daoxin Dai
Centre for Optical and Electromagnetic Research, State Key Laboratory for Modern Optical Instrumentation, College of Optical Science and Engineering, International Research Center for Advanced Photonics, Zhejiang University, Zijingang Campus, Hangzhou 310058, China
A design rule for a Mach-Zehnder interferometer (MZI) sensor is presented, allowing tunable sensitivity by appropriately choosing the MZI arm lengths according to the formula given in this paper. The present MZI sensor designed by this method can achieve an ultra-high sensitivity, which is much higher than any other traditional MZI sensors. An example is given with silicon-on-insulator (SOI) nanowires and the device sensitivity is as high as 106 nm/refractive-index -unit (or even higher), by choosing the MZI arms appropriately. This makes it possible for one to realize a low-cost optical sensing system with a detection limit as high as 10−6 refractive-index-unit, even when a cheap optical spectrum analyzer with low-resolution (e.g., 1 nm) is used for the wavelength-shift measurement.
