Models of Printed Circuit Boards Conductive Pattern Defects

Abstract

A number of PCB defects, though having passed successfully the defect identification procedure, can potentially grow into critical defects under the influence of various external and (or) internal influences. The complex nature of the development of defects leading to PCB failures demands developing and updating the data measuring systems not only for detection but also for the prediction of future development of PCB defects considering the external influences. To solve this problem, it is necessary to analyse the models of defect development, which will allow predicting the defect growth and working out the mathematical models for their studies.

Keywords

• conductive paths
• mathematical model
• mechanical stresses
• pcb defect
• printed circuit board