Growth and characterization of detector-grade CdMnTeSe

Abstract

The Cd0.95Mn0.05Te0.98Se0.02 (CMTS) ingot was grown by the vertical Bridgman technique at low pressure. All wafers showed high resistivity, which suggests potential as a room-temperature semiconductor detector. The resistivity of the CMTS planar detector was 1.47 × 1010 Ω· cm and mobility lifetime product of electrons was 1.29 × 10−3 cm2/V. The spectroscopic property with Am-241 and Co-57 was evaluated. The energy resolution about 59.5 keV gamma-ray of Am-241 was 11% and the photo-peak of 122 keV gamma-ray from Co-57 was clearly distinguished. The result shows the first detector-grade CMTS in the world and proves CMTS’s potential as a radiation detector operating at room temperature.

Keywords

• CdMnTeSe
• Vertical bridgman technique
• Radiation detector
• Characterization