Depth distribution of secondary phases in kesterite Cu2ZnSnS4 by angle-resolved X-ray absorption spectroscopy
J. Just,
D. Lützenkirchen-Hecht,
O. Müller,
R. Frahm,
T. Unold
Affiliations
J. Just
Department Structure and Dynamics of Energy Materials, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin, Germany
D. Lützenkirchen-Hecht
Fakultät 4–Physik, Bergische Universität Wuppertal, Gaussstrasse 20, 42109 Wuppertal, Germany
O. Müller
Stanford Synchrotron Radiation Lightsource (SSRL), SLAC National Accelerator Laboratory, Stanford University, Menlo Park, California 94025, USA
R. Frahm
Fakultät 4–Physik, Bergische Universität Wuppertal, Gaussstrasse 20, 42109 Wuppertal, Germany
T. Unold
Department Structure and Dynamics of Energy Materials, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin, Germany
The depth distribution of secondary phases in the solar cell absorber material Cu2ZnSnS4 (CZTS) is quantitatively investigated using X-ray Absorption Near Edge Structure (XANES) analysis at the K-edge of sulfur at varying incidence angles. Varying information depths from several nanometers up to the full thickness is achieved. A quantitative profile of the phase distribution is obtained by a self-consistent fit of a multilayer model to the XANES spectra for different angles. Single step co-evaporated CZTS thin-films are found to exhibit zinc and copper sulfide secondary phases preferentially at the front or back interfaces of the film.
