IEEE Photonics Journal (Jan 2018)

Characterization of SiPMs With NIR Long-Pass Interferential and Plastic Filters

  • Massimo Mazzillo,
  • Lidia Maddiona,
  • Francesco Rundo,
  • Antonella Sciuto,
  • Sebania Libertino,
  • Salvatore Lombardo,
  • Giorgio Fallica

DOI
https://doi.org/10.1109/JPHOT.2018.2834738
Journal volume & issue
Vol. 10, no. 3
pp. 1 – 12

Abstract

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In this paper, we report on the performances of silicon photomultipliers (SiPMs) with commercial long-pass interferential and plastic filters integrated on the detector's package for environmental light rejection. Several applications, including functional near infrared (NIR) spectroscopy or light detection and ranging, would benefit from the use of highly sensitive detectors like SiPMs with optimized electro-optical characteristics in NIR wavelength range. To this purpose, it is fundamental to reduce the absorption of environmental spurious light leading in application to a decrease of the detector's sensitivity, especially for very weak photon fluxes. We will show how the use of both types of filters has a relevant impact on the electro-optical performances of the bare detectors, in terms of cross talk reduction at high overvoltage values, detection efficiency, spectral response and capability to shield effectively the devices from the absorption of stray light, at the different light wavelengths used for the measurements.

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