Quasi Real-Time Apple Defect Segmentation Using Deep Learning

Abstract

Defect segmentation of apples is an important task in the agriculture industry for quality control and food safety. In this paper, we propose a deep learning approach for the automated segmentation of apple defects using convolutional neural networks (CNNs) based on a U-shaped architecture with skip-connections only within the noise reduction block. An ad-hoc data synthesis technique has been designed to increase the number of samples and at the same time to reduce neural network overfitting. We evaluate our model on a dataset of multi-spectral apple images with pixel-wise annotations for several types of defects. In this paper, we show that our proposal outperforms in terms of segmentation accuracy general-purpose deep learning architectures commonly used for segmentation tasks. From the application point of view, we improve the previous methods for apple defect segmentation. A measure of the computational cost shows that our proposal can be employed in real-time (about 100 frame-per-second on GPU) and in quasi-real-time (about 7/8 frame-per-second on CPU) visual-based apple inspection. To further improve the applicability of the method, we investigate the potential of using only RGB images instead of multi-spectral images as input images. The results prove that the accuracy in this case is almost comparable with the multi-spectral case.

Keywords

• apple defect segmentation
• multispectral imaging
• real-time deep learning
• visual inspection