Applied Microscopy (Nov 2019)

Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy

  • Yun-Yeong Chang,
  • Heung Nam Han,
  • Miyoung Kim

DOI
https://doi.org/10.1186/s42649-019-0013-5
Journal volume & issue
Vol. 49, no. 1
pp. 1 – 7

Abstract

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Abstract Two-dimensional materials such as transition metal dichalcogenide and graphene are of great interest due to their intriguing electronic and optical properties such as metal-insulator transition based on structural variation. Accordingly, detailed analyses of structural tunability with transmission electron microscopy have become increasingly important for understanding atomic configurations. This review presents a few analyses that can be applied to two-dimensional materials using transmission electron microscopy.

Keywords