Matter and Radiation at Extremes (Jan 2022)

Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope

  • S. Z. Yi,
  • J. Q. Dong,
  • L. Jiang,
  • Q. S. Huang,
  • E. F. Guo,
  • Wang Z. S.

DOI
https://doi.org/10.1063/5.0062758
Journal volume & issue
Vol. 7, no. 1
pp. 015902 – 015902-6

Abstract

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A simultaneous high-resolution x-ray backlighting and self-emission imaging method for laser-produced plasma diagnostics is developed in which two Kirkpatrick–Baez imaging channels for high-energy and low-energy diagnostics are constructed using a combination of multilayer mirrors in near-coaxial form. By using a streak or framing camera placed on the image plane, both backlit and self-emission images of a laser-produced plasma with high spatial and temporal resolution can be obtained simultaneously in a single shot. This paper describes the details of the method with regard to its optical and multilayer design, assembly, and alignment method. In addition, x-ray imaging results with a spatial resolution better than 5 µm in the laboratory and experimental results with imploding capsules in the SG-III prototype laser facility are presented.