Feedback Stabilized Optical Fabry–Pérot Interferometer Based on Twin-Core Fiber for Multidimension Microdisplacement Sensing

Chuanbiao Zhang; Tigang Ning; Jingjing Zheng; Jing Li; Heng Lin; Xuekai Gao; Li Pei

doi:10.1109/JPHOT.2017.2741502

IEEE Photonics Journal (Jan 2017)

Feedback Stabilized Optical Fabry–Pérot Interferometer Based on Twin-Core Fiber for Multidimension Microdisplacement Sensing

Chuanbiao Zhang,
Tigang Ning,
Jingjing Zheng,
Jing Li,
Heng Lin,
Xuekai Gao,
Li Pei

Affiliations

Chuanbiao Zhang: Key Lab of All Optical Network and Advanced Telecommunication Network of EMC, Beijing Jiaotong University, Beijing, China
Tigang Ning: Key Lab of All Optical Network and Advanced Telecommunication Network of EMC, Beijing Jiaotong University, Beijing, China
Jingjing Zheng: Key Lab of All Optical Network and Advanced Telecommunication Network of EMC, Beijing Jiaotong University, Beijing, China
Jing Li: Key Lab of All Optical Network and Advanced Telecommunication Network of EMC, Beijing Jiaotong University, Beijing, China
Heng Lin: Key Lab of All Optical Network and Advanced Telecommunication Network of EMC, Beijing Jiaotong University, Beijing, China
Xuekai Gao: Key Lab of All Optical Network and Advanced Telecommunication Network of EMC, Beijing Jiaotong University, Beijing, China
Li Pei: Key Lab of All Optical Network and Advanced Telecommunication Network of EMC, Beijing Jiaotong University, Beijing, China

DOI: https://doi.org/10.1109/JPHOT.2017.2741502
Journal volume & issue: Vol. 9, no. 5
pp. 1 – 9

Abstract

Read online

A novel optical Fabry–Pérot interferometer (FPI) is proposed and experimentally demonstrated for multidimension microdisplacement sensing (MMS). The sensor structure consists of a section of twin-core fiber with a length of 2.4 cm and a section of feedback fiber (FBF) fabricated by normal single-mode fiber. The end faces of two fibers can be formed as the reflection cavity (RC) of the FPI. Mounting the sensor on translation stages, and moving the FBF in different directions to change the RC, the changing mode interference of the reflected beam can be measured. A maximum microdisplacement sensitivity of 0.954 nm/μm with a higher resolution 0.052 μm was achieved. Due to the advantages of the MMS and simple configuration, the sensor is significantly beneficial to practical application.

Published in IEEE Photonics Journal

ISSN: 1943-0655 (Online)
Publisher: IEEE
Country of publisher: United States
LCC subjects: Technology: Engineering (General). Civil engineering (General): Applied optics. Photonics; Science: Physics: Optics. Light
Website: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4563994

About the journal

Abstract

Keywords