A Bi-Pronged Attempt at Normalizing DL-EPRT Vis-à-Vis Grain-Boundary/σ-Phase Locales in Thermally Sensitized UNS S32205 Duplex Stainless Steel

Abstract

In a quest to vet UNS S32205 as a potential structural material to serve moderate-to-high temperature operations of NPP auxiliary components, the DL-EPR test was exploited. A bifronted scheme comprised of 650 and 850 °C discrete treatments intended to explore progressive eutectoid decomposition and degree-of-sensitization (DoS) scenarios was adopted. The nuance witnessed with yet another dual approach—the Cihal- and image processing (IP)-normalized signal landscape—was rationalized through its attribution to culprit microstructures. This was sought, inter alia, in the vicinity of grain boundaries and σ-phase inclusions by virtue of postmortem FESEM, STEM-EDX, HRTEM SAED and XRD ascertainment. Discernable reactivation-kinetics resurgence was believed to mark the onset of deleterious σ-phase dissolution. This only came into fruition with longer ageing times (8–17 h) at 650 °C and succumbed to prematurely (1 h), and at DC biases more cathodic than −0.25 VAg/AgCl with the 850 °C counterpart. Opportune corroboration was offered in ir/ia breakaway for the respective conditions, which was unveiled to be particularly pre-emptive (5 h) with IP- vs. Cihal-normalized peers (8 h) related to the 650 °C condition. Meanwhile, the 850 °C condition endured a similar surge after as little as 1 h of ageing across the board, which hints at concomitant sigma-phase culpability.

Keywords

• degree of sensitization
• double-loop electrochemical potentiokinetic reactivation
• normalization
• Cihal method
• image processing