Nature Communications (Nov 2018)
Silicon as a ubiquitous contaminant in graphene derivatives with significant impact on device performance
- Rouhollah Jalili,
- Dorna Esrafilzadeh,
- Seyed Hamed Aboutalebi,
- Ylias M. Sabri,
- Ahmad E. Kandjani,
- Suresh K. Bhargava,
- Enrico Della Gaspera,
- Thomas R. Gengenbach,
- Ashley Walker,
- Yunfeng Chao,
- Caiyun Wang,
- Hossein Alimadadi,
- David R. G. Mitchell,
- David L. Officer,
- Douglas R. MacFarlane,
- Gordon G. Wallace
Affiliations
- Rouhollah Jalili
- School of Science, RMIT University
- Dorna Esrafilzadeh
- School of Engineering, RMIT University
- Seyed Hamed Aboutalebi
- Institute for Superconducting and Electronic Materials, Australian Institute for Innovative Materials, University of Wollongong
- Ylias M. Sabri
- Centre for Advanced Materials and Industrial Chemistry (CAMIC), School of Science, RMIT University
- Ahmad E. Kandjani
- Centre for Advanced Materials and Industrial Chemistry (CAMIC), School of Science, RMIT University
- Suresh K. Bhargava
- Centre for Advanced Materials and Industrial Chemistry (CAMIC), School of Science, RMIT University
- Enrico Della Gaspera
- School of Science, RMIT University
- Thomas R. Gengenbach
- Manufacturing, Commonwealth Scientific and Industrial Research Organisation
- Ashley Walker
- Intelligent Polymer Research Institute & ARC Centre of Excellence for Electromaterials Science, Australian Institute for Innovative Materials, University of Wollongong
- Yunfeng Chao
- Intelligent Polymer Research Institute & ARC Centre of Excellence for Electromaterials Science, Australian Institute for Innovative Materials, University of Wollongong
- Caiyun Wang
- Intelligent Polymer Research Institute & ARC Centre of Excellence for Electromaterials Science, Australian Institute for Innovative Materials, University of Wollongong
- Hossein Alimadadi
- DTU Danchip/Cen, Technical University of Denmark, Center for Electron Nanoscopy
- David R. G. Mitchell
- Electron Microscopy Centre, Australian Institute for Innovative Materials, University of Wollongong
- David L. Officer
- Intelligent Polymer Research Institute & ARC Centre of Excellence for Electromaterials Science, Australian Institute for Innovative Materials, University of Wollongong
- Douglas R. MacFarlane
- ARC Centre of Excellence for Electromaterials Science, Monash University
- Gordon G. Wallace
- Intelligent Polymer Research Institute & ARC Centre of Excellence for Electromaterials Science, Australian Institute for Innovative Materials, University of Wollongong
- DOI
- https://doi.org/10.1038/s41467-018-07396-3
- Journal volume & issue
-
Vol. 9,
no. 1
pp. 1 – 13
Abstract
Silicon-based contaminants are ubiquitous in natural graphite, and they are thus expected to be present in exfoliated graphene. Here, the authors show that such impurities play a non-negligible role in graphene-based devices, and use high-purity parent graphite to boost the performance of graphene sensors and supercapacitor microelectrodes.
