Micromachines (Jan 2023)
A Derating-Sensitive Tantalum Polymer Capacitor’s Failure Rate within a DC-DC eGaN-FET-Based PoL Converter Workbench Study
Abstract
Many recent studies have revealed that PoL (Point of Load) converters’ output capacitors are a paramount component from a reliability point of view. To receive the maximum degree of reliability in many applications, designers are often advised to derate this capacitor—as such, a careful comprehending of it is required to determine the converter’s overall parameters. PoL converters are commonly found in many electronic systems. Their most important requirements are a stable output voltage with load current variation, good temperature stability, low output ripple voltage, and high efficiency and reliability. If the electronic system in question must be portable, a small footprint and volume are also important considerations—both of which have recently been well accomplished in eGaN transistor technologies. This paper provides details on how derating an output capacitor—specifically, a conductive tantalum polymer surface-mount chip, as this type of capacitor represented a step forward in miniaturization and reliability over previously existing wet electrolytic capacitors—used within a discrete eGaN-FET-based PoL buck converter determines the best performance and the highest MTBF. A setup based on an EPC eGaN FET transistor enclosed in a 9059/30 V evaluation board with a 12 V input voltage/1.2 V output voltage was tested in order to achieve the study’s main scope. Typical electrical performance and reliability data are often provided for customers by manufacturers through technical papers; this kind of public data is often selected to show the capacitors in a favorable light—still, they provide much useful information. In this paper, the capacitor derating process was presented to give a basic overview of the reliability performance characteristics of tantalum polymer capacitor when used within a DC–DC buck converter’s output filter. Performing calculations of the capacitor’s failure rate based on taking a thermal scan of the capacitor’s capsule surface temperature, the behavior of the PoL converter was evaluated.
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