A Study of Residual Image in Charged-Coupled Device

Abstract

For an image sensor CCD, electrons can be trapped at the front-side Si-SiO_2 surface interface in a case of exceeding the full well by bright source. Residual images can be made by the electrons remaining in the interface. These residual images are seen in the front-side-illuminated CCDs especially. It is not easy to find a quantitative analysis for this phenomenon in the domestic reports, although it is able to contaminate observation data. In this study, we find residual images in dark frames which were obtained from the front-side-illuminated CCD at Mt. Lemmon Optical Astronomy Observatory (LOAO), and analyze the effect to contaminated observation data by residual charges.

Keywords

• CCD
• residual image
• analysis