Influence of dislocation structure on electrical and spectroscopic properties of MoOx/p-CdTe/MoOx heterostructures

Abstract

The defective structure of p-CdTe:Cl single crystals and MoOx/p-CdTe/MoOx heterostructures were investigated by high-resolution X-wave diffractometry methods. Different models of dislocation systems were used and the dislocation densities were estimated from the Williamson-Hall plot. It is noted that significant deformations of the mismatch in the transition layer negatively affect the current–voltage characteristics of heterostructures.

Keywords

• cadmium telluride
• defect structure
• x-ray multiaxial diffractometry
• heterostructures
• x- and γ-radiation detectors