Фізика і хімія твердого тіла (Jun 2020)

Physical-topology modeling of silicon/gallium arsenide Schottky transistor of submicron technology LSI

  • S. P. Novosyadliy,
  • V. M. Lukovkin,
  • R. Melnyk,
  • A. V. Pavlyshyn

DOI
https://doi.org/10.15330/pcss.21.2.361-364
Journal volume & issue
Vol. 21, no. 2
pp. 361 – 364

Abstract

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In this paper described researched essentials and physical mechanisms of MESFET on epitaxy layers of GaAs with monocrystalline silicon wafer. Conducted computer modeling of MESFET with p-channel: distributions of potential, volumetric charge, current in channel and its characteristics. Based on conducted modeling discovered new effect in MESFET, shielding of volumetric charge, which sufficiently influences on current distribution in channel.

Keywords