Electrical Stabilization of Surface Resistivity in Epitaxial Graphene Systems by Amorphous Boron Nitride Encapsulation

• Albert F. Rigosi,
• Chieh-I Liu,
• Nicholas R. Glavin,
• Yanfei Yang,
• Heather M. Hill,
• Jiuning Hu,
• Angela R. Hight Walker,
• Curt A. Richter,
• Randolph E. Elmquist,
• David B. Newell

Affiliations

Albert F. Rigosi

Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States

Chieh-I Liu

Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States

Nicholas R. Glavin

Materials and Manufacturing Directorate, Air Force Research Laboratory, Dayton, Ohio, United States

Yanfei Yang

Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States

Heather M. Hill

Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States

Jiuning Hu

Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States

Angela R. Hight Walker

Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States

Curt A. Richter

Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States

Randolph E. Elmquist

Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States

David B. Newell

Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States