Crystals (Jan 2021)

A Comparison Study on Multilayered Barrier Oxide Structure in Charge Trap Flash for Synaptic Operation

  • Minkyung Kim,
  • Eunpyo Park,
  • In Soo Kim,
  • Jongkil Park,
  • Jaewook Kim,
  • YeonJoo Jeong,
  • Suyoun Lee,
  • Inho Kim,
  • Jong-Keuk Park,
  • Tae-Yeon Seong,
  • Joon Young Kwak

DOI
https://doi.org/10.3390/cryst11010070
Journal volume & issue
Vol. 11, no. 1
p. 70

Abstract

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A synaptic device that contains weight information between two neurons is one of the essential components in a neuromorphic system, which needs highly linear and symmetric characteristics of weight update. In this study, a charge trap flash (CTF) memory device with a multilayered high-κ barrier oxide structure on the MoS2 channel is proposed. The fabricated device was oxide-engineered on the barrier oxide layers to achieve improved synaptic functions. A comparison study between two fabricated devices with different barrier oxide materials (Al2O3 and SiO2) suggests that a high-κ barrier oxide structure improves the synaptic operations by demonstrating the increased on/off ratio and symmetry of synaptic weight updates due to a better coupling ratio. Lastly, the fabricated device has demonstrated reliable potentiation and depression behaviors and spike-timing-dependent plasticity (STDP) for use in a spiking neural network (SNN) neuromorphic system.

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