A continuous-profile diffractive focuser for terahertz radiation fabricated by laser ablation of silicon

Abstract

A method of high-frequency laser ablation using a two-coordinate beam scanner for the fabrication of a diffractive element of terahertz range with a continuous profile has been developed and successfully applied. Results of the characterization of the fabricated microrelief of a silicon focuser of a Gaussian beam into a square region are presented.

Keywords

• diffractive optics
• free-electron lasers
• terahertz radiation
• laser ablation