Dose dependence of the spectral characteristics of sigma-delta analog-to-digital converters

Abstract

This paper presents the results of the study of sigma-delta analog-to-digital converters` main spectral parameters` dependence on the total ionizing dose (TID). Within the framework of this study the main parameters of analog-to-digital converters (ADC) (dynamic, static and electrical) were controlled. The main dynamic characteristics of sigma-delta ADC are signal-to-noise ratio (SNR), spurious-free dynamic range (SFDR), signal-to-noise and distortion ratio (SINAD) and total harmonic distortion (THD). Those have been determined from the spectrum of digitized sine signal using the fast Fourier transform (FFT). Static parameters (integrated nonlinearity (INL), offset and gain errors) were determined using a straight line that linearizes the transfer function, according to the method which is described in the IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters. National Instruments modular measuring equipment was used for testing ADC`s parameters. Comparative data on the dose dependence of static and dynamic parameters of two sigma-delta ADC and one sigma-delta modulator are obtained. Based on the results, it was concluded that the most sensitive parameters of sigma-delta ADC to TID are its dynamic parameters. Therefore, when assessing the sigma-delta ADC`s radiation hardness, the spectral characteristics of absorbed dose should be kept under control.

Keywords

• analog-to-digital converter, sigma-delta, histogram method, adc`s static parameters, adc`s dynamic parameters, chip testing, total ionizing dose.