A New Test Algorithm and Fault Simulator of Simplified Three-Cell Coupling Faults for Random Access Memories

Abstract

This study introduces a novel algorithm for the detection of three-cell coupling faults, March ML3C, along with a simulator, TCFS. The March ML3C algorithm targets the detection of single-port, static, and unlinked three-cell coupling faults within bit-oriented random access memory (RAM). March ML3C improves the coverage of three-cell coupling faults to 100%, with a complexity of only 58n (n is the number of memory cells), which is lower than that of most similar algorithms. Furthermore, to solve the problem of none of the existing tools supporting the simulation of three-cell coupling faults, this study designs and implements TCFS, which can quickly simulate all March-type algorithms and calculate the coverages for three-cell coupling faults, thus achieving the purpose of software simulation of the algorithms. The simulation results of March ML3C and other similar algorithms using TCFS are also presented in this paper.

Keywords

• Design for testability
• fault simulator
• march algorithm
• memory testing
• three-cell coupling fault