Liquid crystal display (LCD) is a display device based on liquid crystal electro-optic effect, and LCDs have gradually appeared and have become an indispensable part of people’s lives. In the development of LCD technology, the detection of Mura defects is a key concern in the manufacturing process. The Mura defect is a kind of display defect with low contrast and an irregular shape. This study first explains the mechanism of Mura defects in the LCD manufacturing process and classifies typical Mura defects. Then, three main purposes for the defect detection of LCDs are compared, and the advantages and disadvantages are conducted. Following that, this research examines reviews the linked literature on image preprocessing, feature extraction, dimension reduction, and classifiers of Mura defects. Finally, the future development trend and research direction of Mura defect detection based on machine vision can be drawn by this study.
