Real-space light-reflection mapping of atomically thin WSe2 flakes revealing the gradient local strain

Abstract

The spatially continuous control of the physical properties in semiconductor materials is an important strategy in increasing electron-capturing or light-harvesting efficiencies, which is highly desirable for the application of optoelectronic devices including photodetectors, solar cells and biosensors. Unlike the multi-layer growth of chemical composition modulation, local strain offers a convenient way to continuously tune the physical properties of a single semiconductor layer, and open up new possibility for band engineering within the 2D plane. Here, we demonstrate that the gradient refractive index and bandgap can be generated in atomically thin transition metal dichalcogenide flakes due to the effect of thermal strain difference. A highly resolved confocal scanning optical microscopy is used to perform a real-space light-reflection mapping of suspended atomically thin WSe _2 flakes at the low temperature of 4.2 K, in which the parabolic light-reflection profiles have been observed on suspended monolayer and bilayer WSe _2 flakes. This finding is corroborated by our theoretical model which includes the effect of strain on both the refractive index and bandgap of nanostructures. The inhomogeneous local strain observed here will allow new device functionalities to be integrated within 2D layered materials, such as in-plane photodetectors and photovoltaic devices.

Keywords

• 2D layered materials
• transition metal dichalcogenides
• local strain
• confocal scanning optical microscopy