Submicronic-Scale Mechanochemical Characterization of Oxygen-Enriched Materials
Marie Garnier,
Eric Lesniewska,
Virgil Optasanu,
Bruno Guelorget,
Pascal Berger,
Luc Lavisse,
Manuel François,
Irma Custovic,
Nicolas Pocholle,
Eric Bourillot
Affiliations
Marie Garnier
Laboratory Interdisciplinaire Carnot de Bourgogne (ICB), UMR 6303 CNRS, University of Bourgogne, 21000 Dijon, France
Eric Lesniewska
Laboratory Interdisciplinaire Carnot de Bourgogne (ICB), UMR 6303 CNRS, University of Bourgogne, 21000 Dijon, France
Virgil Optasanu
Laboratory Interdisciplinaire Carnot de Bourgogne (ICB), UMR 6303 CNRS, University of Bourgogne, 21000 Dijon, France
Bruno Guelorget
Laboratory of Mechanical & Material Engineering (UR LASMIS), University of Technology Troyes, 10300 Troyes, France
Pascal Berger
Laboratory Nanoscience and Innovation for Materials, Biomedecine and Energy (NIMBE), UMR 3685 CEA-CNRS, University of Paris-Saclay, 91191 Gif-sur-Yvette, France
Luc Lavisse
Laboratory Interdisciplinaire Carnot de Bourgogne (ICB), UMR 6303 CNRS, University of Bourgogne, 21000 Dijon, France
Manuel François
Laboratory of Mechanical & Material Engineering (UR LASMIS), University of Technology Troyes, 10300 Troyes, France
Irma Custovic
Laboratory Interdisciplinaire Carnot de Bourgogne (ICB), UMR 6303 CNRS, University of Bourgogne, 21000 Dijon, France
Nicolas Pocholle
Laboratory Interdisciplinaire Carnot de Bourgogne (ICB), UMR 6303 CNRS, University of Bourgogne, 21000 Dijon, France
Eric Bourillot
Laboratory Interdisciplinaire Carnot de Bourgogne (ICB), UMR 6303 CNRS, University of Bourgogne, 21000 Dijon, France
Conventional techniques that measure the concentration of light elements in metallic materials lack high-resolution performance due to their intrinsic limitation of sensitivity. In that context, scanning microwave microscopy has the potential to significantly enhance the quantification of element distribution due to its ability to perform a tomographic investigation of the sample. Scanning microwave microscopy associates the local electromagnetic measurement and the nanoscale resolution of an atomic force microscope. This technique allows the simultaneous characterization of oxygen concentration as well as local mechanical properties by microwave phase shift and amplitude signal, respectively. The technique was calibrated by comparison with nuclear reaction analysis and nanoindentation measurement. We demonstrated the reliability of the scanning microwave technique by studying thin oxygen-enriched layers on a Ti-6Al-4V alloy. This innovative approach opens novel possibilities for the indirect quantification of light chemical element diffusion in metallic materials. This technique is applicable to the control and optimization of industrial processes.
