Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy
S. Fernandez-Peña,
C. Lichtensteiger,
P. Zubko,
C. Weymann,
S. Gariglio,
J.-M. Triscone
Affiliations
S. Fernandez-Peña
DQMP, University of Geneva, 24 Quai E. Ansermet, 1211 Geneva 4, Switzerland
C. Lichtensteiger
DQMP, University of Geneva, 24 Quai E. Ansermet, 1211 Geneva 4, Switzerland
P. Zubko
London Centre for Nanotechnology and Department of Physics and Astronomy, University College London, 17–19 Gordon Street, London WC1H 0HA, United Kingdom
C. Weymann
DQMP, University of Geneva, 24 Quai E. Ansermet, 1211 Geneva 4, Switzerland
S. Gariglio
DQMP, University of Geneva, 24 Quai E. Ansermet, 1211 Geneva 4, Switzerland
J.-M. Triscone
DQMP, University of Geneva, 24 Quai E. Ansermet, 1211 Geneva 4, Switzerland
We present a detailed study of compressively strained PbxSr1−xTiO3 thin films grown by off-axis radio frequency magnetron sputtering on (001)-oriented Nb-doped SrTiO3 substrates. Film tetragonality and the ferroelectric critical temperatures are measured for samples of different composition and thickness and compared with a phenomenological Landau-Devonshire model. 180∘ ferroelectric domains are observed using both X-ray diffraction and piezoresponse force microscopy and domain sizes obtained by the two techniques are compared and discussed.
