Applied Sciences (May 2024)

X-ray Line-Intensity Ratios in Neon-like Xenon: Significantly Reducing the Discrepancy between Measurements and Simulations

  • Shihan Huang,
  • Zhiming Tang,
  • Yang Yang,
  • Hongming Zhang,
  • Ziqiang Tian,
  • Shaokun Ma,
  • Jinyu Li,
  • Chao Zeng,
  • Huajian Ji,
  • Ke Yao,
  • Yaming Zou

DOI
https://doi.org/10.3390/app14114381
Journal volume & issue
Vol. 14, no. 11
p. 4381

Abstract

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The X-ray spectra of L-shell transitions in Neon-like Xenon ion (Xe44+) have been precisely measured at the Shanghai Electron-Beam Ion Trap using a high-resolution crystal spectrometer. Focusing on the line-intensity ratio of the 3F {2p6-(2p51/23s1/2)J=1} and 3D {2p6-(2p53/23d5/2)J=1} lines (3F/3D), our measurements have achieved remarkable precision improvements over the previous studies. These spectra have been simulated using the collisional-radiative model (CRM) within the Flexible Atomic Code, showing good agreement with the measurements. The previously reported discrepancies, approximately ranging from 10% to 20%, have been significantly reduced in this work to below 1.4% for electron-beam energies exceeding 6 keV and to around 7% for lower energies. Furthermore, our analysis of population fluxes of the involved levels reveals a very high sensitivity of the 3F line to radiation cascades. This suggests that the current CRM, which conventionally excludes interionic population transfer processes, may underestimate the population of the upper level of the 3F line and the cascade-related higher levels, thus explaining the remaining discrepancies. These findings provide a solid foundation for further minimizing these discrepancies and are crucial for understanding the atomic structure and plasma model of these ions.

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