Metrology of Nanostructures by Tomographic Mueller-Matrix Scatterometry

Abstract

The development of necessary instrumentation and metrology at the nanoscale, especially fast, low-cost, and nondestructive metrology techniques, is of great significance for the realization of reliable and repeatable nanomanufacturing. In this work, we present the application of a homemade novel optical scatterometer called the tomographic Mueller-matrix scatterometer (TMS), for the measurement of photoresist gratings. The TMS adopts a dual rotating-compensator configuration and illuminates the nanostructure sequentially under test conditions by a plane wave, with varying illumination directions and records. For each illumination direction, the polarized scattered field along various directions of observation can be seen in the form of scattering Mueller matrices. That more scattering information is collected by TMS than conventional optical scatterometry ensures that it achieves better measurement sensitivity and accuracy. We also show the capability of TMS for determining both grating pitch and other structural parameters, which is incapable by current zeroth-order methods such as reflectometry- or ellipsometry-based scatterometry.

Keywords

• ellipsometry
• scatterometry
• Mueller matrix
• diffraction grating
• inverse scattering
• pitch measurement