Overview of software tools for modeling single event upsets in microelectronic devices

Abstract

The paper presents the results of the analysis of existing simulation tools for evaluation of single event upset susceptibility of microelectronic devices with deep sub-micron feature sizes. This simulation tools are meant to replace obsolete approach to single event rate estimation based on integral rectangular parallelepiped model. Three main approaches implemented in simulation tools are considered: combined use of particle transport codes and rectangular parallelepiped model, combined use of particle transport codes and analytical models of charge collection and circuit simulators, and combined use of particle transport codes and TCAD simulators.

Keywords

• single event upset
• ionizing particles
• simulation tools