Probing defect dynamics in monolayer MoS2 via noise nanospectroscopy

Abstract

The intrinsic properties of atomically thin MoS2 are believed to be strongly affected by the presence of structural defects; however, the underlying physical mechanism of such link is not fully understood. Here, the authors combine noise-current analysis with atomic force microscopy to explore the relationship between point defects and the anomalous physical properties of MoS2 monolayers.