Variability and Trait Association Studies for Late Leaf Spot Resistance in a Groundnut MAGIC Population

Abstract

Globally, late leaf spot (LLS), a foliar fungal disease is one of the most important biotic constraint in groundnut production. Multi-Parent Advanced Generation Inter Cross (MAGIC) groundnut population was developed in a convergent crossing scheme using eight founder parents to develop a mapping population for multiple traits includes LLS. The experiments conducted in light chamber using detached leaf assay, and disease field screening nurseries at two locations (ICRISAT and ARS, Kasbe Digraj) showed significant variability for LLS resistance and component of resistance traits. Total 10 MAGIC lines with longer incubation (>11.0 days) and two MAGIC lines with longer latent period (>27 days) than the resistant parent, GPBD 4 were identified. The MAGIC lines, ICGR 171413, and ICGR 171443 with a lesion diameter of <1 mm and 4.10–5.67% of leaf area damage can be valuable sources for the alleles limiting the pathogen severity. A total of 20 MAGIC lines recorded significantly superior for disease score at 105 DAP_I (5.60–6.89) compared to resistant check, GPDB 4 (6.89). Further studies to determine the type and number of genes controlling the LLS component traits in groundnut will be useful for improvement of resistance to LLS. Genomic selection approach can be valuable in groundnut breeding to harness the minor alleles contributing to the component traits of LLS resistance.

Keywords

• groundnut
• MAGIC population
• late leaf spot
• detached leaf assay