EPJ Web of Conferences (Mar 2013)

Time and momentum resolved resonant magnetic x-ray diffraction on EuTe

  • Föhlisch A.,
  • Holldack K.,
  • Springholz G.,
  • Kachel T.,
  • Weschke E.,
  • Schierle E.,
  • Trabant C.,
  • Pontius N.,
  • Schüßler-Langeheine C.

DOI
https://doi.org/10.1051/epjconf/20134103014
Journal volume & issue
Vol. 41
p. 03014

Abstract

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We used fs- and ps- resonant magnetic x-ray diffraction to probe the laser-induced changes to the magnetic profile in thin films of the antiferromagnetic semicon-ductor EuTe.