IUCrJ (Sep 2019)

1 kHz fixed-target serial crystallography using a multilayer monochromator and an integrating pixel detector

  • A. Tolstikova,
  • M. Levantino,
  • O. Yefanov,
  • V. Hennicke,
  • P. Fischer,
  • J. Meyer,
  • A. Mozzanica,
  • S. Redford,
  • E. Crosas,
  • N. L. Opara,
  • M. Barthelmess,
  • J. Lieske,
  • D. Oberthuer,
  • E. Wator,
  • I. Mohacsi,
  • M. Wulff,
  • B. Schmitt,
  • H. N. Chapman,
  • A. Meents

DOI
https://doi.org/10.1107/S205225251900914X
Journal volume & issue
Vol. 6, no. 5
pp. 927 – 937

Abstract

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Reliable sample delivery and efficient use of limited beam time have remained bottlenecks for serial crystallography (SX). Using a high-intensity polychromatic X-ray beam in combination with a newly developed charge-integrating JUNGFRAU detector, we have applied the method of fixed-target SX to collect data at a rate of 1 kHz at a synchrotron-radiation facility. According to our data analysis for the given experimental conditions, only about 3 000 diffraction patterns are required for a high-quality diffraction dataset. With indexing rates of up to 25%, recording of such a dataset takes less than 30 s.

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