Multi-pass microscopy

Thomas Juffmann; Brannon B. Klopfer; Timmo L.I. Frankort; Philipp Haslinger; Mark A. Kasevich

doi:10.1038/ncomms12858

Nature Communications (Sep 2016)

Multi-pass microscopy

Thomas Juffmann,
Brannon B. Klopfer,
Timmo L.I. Frankort,
Philipp Haslinger,
Mark A. Kasevich

Affiliations

Thomas Juffmann: Physics Department, Stanford University, 382 Via Pueblo Mall, Stanford, California 94305, USA
Brannon B. Klopfer: Physics Department, Stanford University, 382 Via Pueblo Mall, Stanford, California 94305, USA
Timmo L.I. Frankort: Physics Department, Stanford University, 382 Via Pueblo Mall, Stanford, California 94305, USA
Philipp Haslinger: Department of Physics, University of California–Berkeley, 366 Le Conte Hall MS 7300, Berkeley, California 94720, USA
Mark A. Kasevich: Physics Department, Stanford University, 382 Via Pueblo Mall, Stanford, California 94305, USA

DOI: https://doi.org/10.1038/ncomms12858
Journal volume & issue: Vol. 7, no. 1
pp. 1 – 5

Abstract

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Low-damage and high-precision imaging can be achieved by passing the same probe photons through the specimen more than once, and this has been previously achieved in double-pass transmission microscopy. Here, the authors generalize this idea to full-field multi-pass microscopy using a self-imaging cavity.

Published in Nature Communications

ISSN: 2041-1723 (Online)
Publisher: Nature Portfolio
Country of publisher: United Kingdom
LCC subjects: Science
Website: https://www.nature.com/ncomms/

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