AIP Advances (Feb 2016)

Preparation and characterizations of electroluminescent p-ZnO : N/n-ZnO : Ga/ITO thin films by spray pyrolysis method

  • C. Panatarani,
  • S. Fitriyadi,
  • N. Balasubramanian,
  • N. S. Parmar,
  • I. M. Joni

DOI
https://doi.org/10.1063/1.4942977
Journal volume & issue
Vol. 6, no. 2
pp. 025121 – 025121-10

Abstract

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ZnO thin films were fabricated by spray pyrolysis (SP) method with p-ZnO : N/n-ZnO:Ga/ITO structure. The X-ray results show that the deposited films have hexagonal wurtzite structure. The EDS results observed that the composition of Ga in ZnO:Ga and N in ZnO:N was 3.73% and 27.73% respectively. The photoluminescence (PL) with excitation wave length of 260 nm shows that ZnO:Ga and ZnO:N films emitted UV emission at ∼393 and ∼388 nm, respectively and the films resistivity was 7.12 and 12.80 Ohm-cm respectively. The electroluminescence of the p-ZnO : N/n-ZnO:Ga/ITO structure was obtained by applying forward bias of 5 volt with 30 mA current, resulting in a 3.35 volt threshold bias with the peak electroluminescence in UV-blue range.