Nanotechnology Reviews (Dec 2019)

In situ capabilities of Small Angle X-ray Scattering

  • Feng Jinghua,
  • Kriechbaum Manfred,
  • Liu Li (Emily)

DOI
https://doi.org/10.1515/ntrev-2019-0032
Journal volume & issue
Vol. 8, no. 1
pp. 352 – 369

Abstract

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Small Angle X-ray Scattering (SAXS) is an ideal characterization tool to explore nanoscale systems. In order to investigate nanostructural changes of materials under realistic sample environments, it is essential to equip SAXS with diverse in situ capabilities based on the corresponding requirements. In this paper, we highlight the representative experimental setups and corresponding applications of five widely used in situ capabilities: temperature, pressure, stretching, flow-through, and electric field. Additionally, we also briefly introduce other four in situ techniques including humidity, high-throughput, rheology, and magnetic field.

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