Linewidth narrowing in self-injection locked lasers: Effects of quantum confinement
Artem Prokoshin,
Weng W. Chow,
Bozhang Dong,
Frederic Grillot,
John Bowers,
Yating Wan
Affiliations
Artem Prokoshin
Computer, Electrical and Mathematical Sciences and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Kingdom of Saudi Arabia
Weng W. Chow
Sandia National Laboratories, Albuquerque, New Mexico 87185-1086, USA
Bozhang Dong
Institute for Energy Efficiency, University of California, Santa Barbara, California 93106, USA
Frederic Grillot
LTCI, Telecom Paris, Institute Polytechnique de Paris, 91120 Palaiseau, France
John Bowers
Institute for Energy Efficiency, University of California, Santa Barbara, California 93106, USA
Yating Wan
Computer, Electrical and Mathematical Sciences and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Kingdom of Saudi Arabia
This paper explores the impact of gain medium on linewidth narrowing in integrated self-injection locked III–V/SiN lasers, theoretically and experimentally. We focus on the effects of carrier densities of states in zero- and two-dimensional structures due to quantum-dot and quantum-well confinement. The theoretical approach includes (a) multimode laser interaction to treat mode competition and wave mixing, (b) quantum-optical contributions from spontaneous emission, and (c) composite laser/free-space eigenmodes to describe outcoupling and coupling among components within an extended cavity. For single-cavity lasers, such as distributed feedback lasers, the model reproduces the experimentally observed better linewidth performance of quantum-dot active regions over quantum-well ones. When applied to integrated III–V/SiN lasers, our analysis indicates Hz-level linewidth performance for both quantum-dot and quantum-well gain media due to overcoming the difference in carrier-induced refractive index by incorporating a high-Q SiN passive resonator. Trade-offs are also explored between linewidth, output power, and threshold current.