Signal Amplification Gains of Compressive Sampling for Photocurrent Response Mapping of Optoelectronic Devices

Abstract

Spatial characterisation methods for photodetectors and other optoelectronic devices are necessary for determining local performance, as well as detecting local defects and the non-uniformities of devices. Light beam induced current measurements provide local performance information about devices at their actual operating conditions. Compressed sensing current mapping offers additional specific advantages, such as high speed without the use of complicated experimental layouts or lock-in amplifiers. In this work, the signal amplification advantages of compressed sensing current mapping are presented. It is demonstrated that the sparsity of the patterns used for compressive sampling can be controlled to achieve significant signal amplification of at least two orders of magnitude, while maintaining or increasing the accuracy of measurements. Accurate measurements can be acquired even when a point-by-point scan yields high noise levels, which distort the accuracy of measurements. Pixel-by-pixel comparisons of photocurrent maps are realised using different sensing matrices and reconstruction algorithms for different samples. The results additionally demonstrate that such an optical system would be ideal for investigating compressed sensing procedures for other optical measurement applications, where experimental noise is included.

Keywords

• non-destructive testing
• current mapping
• digital micromirror device
• compressed sensing