Spectrum Intensity Ratio Detection for Frequency Domain Weak Measurement System

Yuxuan Yang; Yang Xu; Tian Guan; Lixuan Shi; Jinyu Li; Dongmei Li; Yonghong He; Xiangnan Wang; Zhangyan Li; Yanhong Ji

doi:10.1109/JPHOT.2019.2942718

IEEE Photonics Journal (Jan 2020)

Spectrum Intensity Ratio Detection for Frequency Domain Weak Measurement System

Yuxuan Yang,
Yang Xu,
Tian Guan,
Lixuan Shi,
Jinyu Li,
Dongmei Li,
Yonghong He,
Xiangnan Wang,
Zhangyan Li,
Yanhong Ji

Affiliations

Yuxuan Yang: Department of Biomedical Engineering, School of Medicine, Tsinghua University, Beijing, China
Yang Xu: ORCiD; Institute of Optical Imaging and Sensing, Graduate School at Shenzhen, Shenzhen Key Laboratory for Minimal Invasive Medical Technologies, Tsinghua University, Shenzhen, China
Tian Guan: Department of Biomedical Engineering, School of Medicine, Tsinghua University, Beijing, China
Lixuan Shi: Institute of Optical Imaging and Sensing, Graduate School at Shenzhen, Shenzhen Key Laboratory for Minimal Invasive Medical Technologies, Tsinghua University, Shenzhen, China
Jinyu Li: State Key Laboratory of Alternate Electrical Power System With Renewable Energy Sources, North China Electric Power University, Beijing, China
Dongmei Li: College of Science, Center for Optics & Optoelectronics Research, Collaborative Innovation Center for Information Technology in Biological and Medical Physics, Zhejiang University of Technology, Hangzhou, China
Yonghong He: ORCiD; Institute of Optical Imaging and Sensing, Graduate School at Shenzhen, Shenzhen Key Laboratory for Minimal Invasive Medical Technologies, Tsinghua University, Shenzhen, China
Xiangnan Wang: Department of Biomedical Engineering, School of Medicine, Tsinghua University, Beijing, China
Zhangyan Li: Institute of Optical Imaging and Sensing, Graduate School at Shenzhen, Shenzhen Key Laboratory for Minimal Invasive Medical Technologies, Tsinghua University, Shenzhen, China
Yanhong Ji: School of Physics and Telecommunication Engineering, South China Normal University, Guangzhou, China

DOI: https://doi.org/10.1109/JPHOT.2019.2942718
Journal volume & issue: Vol. 12, no. 4
pp. 1 – 12

Abstract

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The traditional method of frequency domain weak measurement has a lot of noise. In this paper, we analyze the 2000 curves obtained by experiments and get the conclusion that the signal-to-noise ratio will increase with the increase of signal strength. We simulated the 252 curves produced by the phase change and used this to fit the relationship between the original calculation method and our spectral height ratio (HR) method. Through previous experimental data verification, our method can greatly reduce the system noise of the dual-mode working area in the frequency domain weak measurement. At present, universal frequency domain weak measurement and measurement system have received increasing attention. In this paper, we introduce a frequency domain weak measurement with spectrum height ratio (HR) that can greatly reduce the system noise in the frequency domain weak measurement bimodal work area. Moreover, we completed comparative experiments on a total internal reflection weak measurement system. The experimental results show that the system resolution obtained by using the HR method is 6.33 × 10-7 RIU, which is an order of magnitude higher than that of the conventional center wavelength offset algorithm which is commonly used in weak frequency measurement.

Published in IEEE Photonics Journal

ISSN: 1943-0655 (Online)
Publisher: IEEE
Country of publisher: United States
LCC subjects: Technology: Engineering (General). Civil engineering (General): Applied optics. Photonics; Science: Physics: Optics. Light
Website: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4563994

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