Genetic Synthesis of the Diffraction Profile

Abstract

In this paper we describe theoretical synthesis of the x-ray diffraction line profile as a superposition of the spectral components Ka1 and Ka2 optimized to the experimental data by the genetic algorithm and nonlinear optimization methods 'Nelder-Mead downhill simplex' and Levenberg-Marquardt method. Such combination of global and local optimization methods results in a mathematical model of the diffraction profile, providing reliable determininig of diffraction line characteristics for the material structure properties study. Experimetal results of the optimization preocedures are given too.

Keywords

• diffraction profile
• genetic algorithm
• nonlinear optimization
• mathematical model.