Cytoplasmic effects on grain resistance to yellowberry in durum wheat

Abstract

Parental, F1, reciprocal F1 (RF1), F2, reciprocal F2 (RF2), BC1P1 and BC1P2 generations of four crosses involving four cultivars of durum wheat (Triticum durum Desf.) were evaluated for grain resistance to yellowberry. Significant differences were reported for F1, F2 and their reciprocals in all crosses. A generation means analysis indicated the inadequacy of additive-dominance model and additive-dominance model considering maternal effects. However, the variation in generation means in the four crosses could be explained by a digenic epistatic model with cytoplasmic effects. Cytoplasmic effects were significant and consistent in all the crosses. Dominance effects and additive × dominance epistasis were more important than additive effects and other epistatic components. The choice of a female parent possessing grain resistance to yellowberry appeared to be decisive in durum wheat breeding for resistance to this serious seed disorder.

Keywords

• cytoplasmic effects
• resistance to yellowberry
• triticum durum