Journal of Advanced Dielectrics (Jun 2017)

The influence of Bi content on dielectric properties of Bi4–xTi3O12–1.5x ceramics

  • Hui Gong,
  • Xiying Ke,
  • Shuqin Yang,
  • Zhaozhi Li,
  • Huyin Su,
  • Cancan Zhang,
  • Qian Luo,
  • Qi Chen,
  • Lingfang Xu,
  • Yong Chen,
  • Wei Wang

DOI
https://doi.org/10.1142/S2010135X17500217
Journal volume & issue
Vol. 7, no. 3
pp. 1750021-1 – 1750021-6

Abstract

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A kind of lead-free dielectric materials, such as the bismuth layered perovskite-type structure of Bi4–xTi3O12–1.5x (x=0.04,0.02,0,–0.02,–0.04), was prepared by the conventional solid-state method at 800∘C and sintered at 1100∘C. The variation of structure and electrical properties with different Bi concentration was studied. All the Bi4–xTi3O12–1.5x (x=0.04,0.02,0,–0.02,–0.04) samples exhibited a single structured phase. SEM could be a better approach to present the microstructure of Bi4–xTi3O12–1.5x (x=0.04,0.02,0,–0.02,–0.04) ceramics. It could be found that the grain size of Bi4.02Ti3O12.03 sintered at 1100∘C was smaller than that of others among the five samples through grain size mechanics. Through impedance spectra analysis, we knew, when the Bi content was fixed, that the dielectric constant and the loss values increased with the decrease of frequency. The Curie temperature of the five samples was about 670∘C. In particular, while at the frequency of 100kHz, the lowest loss was 0.001 when Bi content was 3.98. The Bi4.02Ti3O12.03 ceramics with the minimum grain size had highest dielectric constant and the relatively low loss. Due to its high Curie temperature, high permittivity and low loss, the Bi4Ti3O12 (BIT) ceramics have a broad application prospect in high density memory, generator, sensor, ferroelectric tunnel junctions and so on.

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