Nd3-xBixFe4GaO12 (x = 2, 2.5) films on glass substrates prepared by MOD method

Yoshida T.; Oishi K.; Nishi T.; Ishibashi T.

doi:10.1051/epjconf/20147505009

EPJ Web of Conferences (Jul 2014)

Nd3-xBixFe4GaO12 (x = 2, 2.5) films on glass substrates prepared by MOD method

Yoshida T.,
Oishi K.,
Nishi T.,
Ishibashi T.

Affiliations

Yoshida T.: Department of Materials Science and Technology, Nagaoka University of Technology
Oishi K.: Department of Materials Science and Technology, Nagaoka University of Technology
Nishi T.: Department of Electric Engineering, Kobe City College of Technology
Ishibashi T.: Department of Materials Science and Technology, Nagaoka University of Technology

DOI: https://doi.org/10.1051/epjconf/20147505009
Journal volume & issue: Vol. 75
p. 05009

Abstract

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We studied Nd3-XBiXFe4GaO12 films to obtain perpendicular magnetic anisotropy as well as large Faraday effect. NdBi2Fe4GaO12 (Bi2:NIGG) and Nd0.5Bi2.5Fe4GaO12 (Bi2.5:NIGG) films were obtained on Nd2BiFe4GaO12 (Bi1:NIGG) layer prepared on glass substrates by metal-organic decomposition (MOD) method. Bi2:NIGG and Bi2.5:NIGG films showed large Faraday rotation angles of 7.5 and 10.5 degree/µm, at a wavelength of 520 nm, respectively. Those films have perpendicular magnetic anisotropy with a coercivity of 350 Oe and a saturation magnetic field of 730 Oe.

Published in EPJ Web of Conferences

ISSN: 2100-014X (Online)
Publisher: EDP Sciences
Country of publisher: France
LCC subjects: Science: Physics
Website: http://www.epj-conferences.org/

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